THE MODELING OF THE RECOVERY TIME FOR ELECTRONIC SYSTEMS
Abstract
The article considers the algorithm for defining parameters of the recovery process of some electronic systems which are built on a modern element base. It is assumed that the stochastic process is appeared to be 'Wiener'.
About the Authors
V. E. Emelyanov
МГТУ ГА
Russian Federation
Russian Federation
E. K. Avetisyan
МГТУ ГА
Russian Federation
Russian Federation
V. A. Ivanenko
МГТУ ГА
Russian Federation
Russian Federation
References
1. Sherif Y.S., Allay L.R. Modeling the repairability function by the first passage time distribution of Brownian motion // Microelectr. Reliab., 1991, v.21, №2, p.257…258.
2. Pugachev V.S. Teoriya veroyatnostey i matematicheskaya statistika. – M.: Nauka, 1979
3. Leptser R.SH., SHiryaev A.N. Statistika sluchaynyh protsessov. – M.: Nauka, 1974.
Review
For citations:
Emelyanov V.E., Avetisyan E.K., Ivanenko V.A. THE MODELING OF THE RECOVERY TIME FOR ELECTRONIC SYSTEMS. Civil Aviation High Technologies. 2015;(222):48-51. (In Russ.)
Views:
493
Email this article 
