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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">caht</journal-id><journal-title-group><journal-title xml:lang="ru">Научный вестник МГТУ ГА</journal-title><trans-title-group xml:lang="en"><trans-title>Civil Aviation High Technologies</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2079-0619</issn><issn pub-type="epub">2542-0119</issn><publisher><publisher-name>Moscow State Technical University of Civil Aviation (MSTU CA)</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">caht-171</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>Статьи</subject></subj-group></article-categories><title-group><article-title>МОДЕЛИРОВАНИЕ ВРЕМЕНИ ВОССТАНОВЛЕНИЯ РАДИОЭЛЕКТРОННЫХ СИСТЕМ</article-title><trans-title-group xml:lang="en"><trans-title>THE MODELING OF THE RECOVERY TIME FOR ELECTRONIC SYSTEMS</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Емельянов</surname><given-names>В. Е.</given-names></name><name name-style="western" xml:lang="en"><surname>Emelyanov</surname><given-names>V. E.</given-names></name></name-alternatives><bio xml:lang="ru"><p>доцент, доктор технических наук, профессор</p></bio><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Аветисян</surname><given-names>Э. К.</given-names></name><name name-style="western" xml:lang="en"><surname>Avetisyan</surname><given-names>E. K.</given-names></name></name-alternatives><bio xml:lang="ru"><p>студент V-го курса</p></bio><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Иваненко</surname><given-names>В. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Ivanenko</surname><given-names>V. A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>студент V-го курса</p></bio><email xlink:type="simple">noemail@neicon.ru</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff xml:lang="ru" id="aff-1"><institution>МГТУ ГА</institution><country>Russian Federation</country></aff><pub-date pub-type="collection"><year>2015</year></pub-date><pub-date pub-type="epub"><day>07</day><month>11</month><year>2016</year></pub-date><issue>222</issue><fpage>48</fpage><lpage>51</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Емельянов В.Е., Аветисян Э.К., Иваненко В.А., 2016</copyright-statement><copyright-year>2016</copyright-year><copyright-holder xml:lang="ru">Емельянов В.Е., Аветисян Э.К., Иваненко В.А.</copyright-holder><copyright-holder xml:lang="en">Emelyanov V.E., Avetisyan E.K., Ivanenko V.A.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://avia.mstuca.ru/jour/article/view/171">https://avia.mstuca.ru/jour/article/view/171</self-uri><abstract><p>В работе предложен алгоритм определения параметров процесса восстановления радиоэлектронных систем, выполненных на современной элементной базе. Высказывается предположение, что рассматриваемый случайный процесс является винеровским.</p></abstract><trans-abstract xml:lang="en"><p>The article considers the algorithm for defining parameters of the recovery process of some electronic systems which are built on a modern element base. It is assumed that the stochastic process is appeared to be 'Wiener'.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>время первого прохождения</kwd><kwd>несмещенная оценка</kwd><kwd>максимальное правдоподобие</kwd><kwd>функция восстановления</kwd><kwd>вероятность безотказной работы</kwd></kwd-group><kwd-group xml:lang="en"><kwd>the first pass time</kwd><kwd>unbiased estimator</kwd><kwd>maximum likelihood</kwd><kwd>recovery function</kwd><kwd>the&#13;
probability of failure</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Sherif Y.S., Allay L.R. Modeling the repairability function by the first passage time distribution of Brownian motion // Microelectr. Reliab., 1991, v.21, №2, p.257…258</mixed-citation><mixed-citation xml:lang="en">Sherif Y.S., Allay L.R. Modeling the repairability function by the first passage time distribution of Brownian motion // Microelectr. Reliab., 1991, v.21, №2, p.257…258.</mixed-citation></citation-alternatives></ref><ref id="cit2"><label>2</label><citation-alternatives><mixed-citation xml:lang="ru">Пугачев В.С. Теория вероятностей и математическая статистика. - М.: Наука, 1979</mixed-citation><mixed-citation xml:lang="en">Pugachev V.S. Teoriya veroyatnostey i matematicheskaya statistika. – M.: Nauka, 1979</mixed-citation></citation-alternatives></ref><ref id="cit3"><label>3</label><citation-alternatives><mixed-citation xml:lang="ru">Лепцер Р.Ш., Ширяев А.Н. Статистика случайных процессов. - М.: Наука, 1974</mixed-citation><mixed-citation xml:lang="en">Leptser R.SH., SHiryaev A.N. Statistika sluchaynyh protsessov. – M.: Nauka, 1974.</mixed-citation></citation-alternatives></ref></ref-list><fn-group><fn fn-type="conflict"><p>The authors declare that there are no conflicts of interest present.</p></fn></fn-group></back></article>
